The XMD-300 diffractometer is ideal instrument for qualitative and quantitative phase analysis, peak profile analysis and structure identification.

By using patented Kumakhov polycapillary optics this diffractometer obviates the need for collimators for linear projection of X-Rays.

Available as easy-to-use transport desktop unit, XMD - 300 series offers versatile design that integrates convenient handling of large samples into a compact desktop unit.

A cost effective analytical X-ray tool for researchers, technologists and material scientists.

A multifunctional XRD instrument for a wide range of material characterisation

• Pharmaceuticals
• Engineering processes
• Alloys and process Metallurgy
• Cement, chemical and fertilizer industries
• Industrial by-products
• Ceramics and refractories
• Determinative Mineralogy
• Geology and mining
• Forensic science
• Archaeology and art studies
• Environmental monitoring
• University and educational laboratories

Analysis of powder samples

• Optimised beam collimation using patented Kumakhov polycapillary optics
• Polycapillary half lens allows analysis of uneven samples
• No need for monochromators, collimators and slits for linear projection of X-rays
• Air cooled low power X-ray tube
• Rapid data collection utilizing high performance PSD
• Parallel beam geometry
• Large and radiation opaque chamber for bulk sample analysis
• Spinner for powder samples
• Transportable and compact design
• Quantitative phase analysis by RIR (Reference Intensity Ratio) method using full-profile match techniques

Rapid data collection utilizing high performance PSD detector

Please fill in our Online Enquiry Form.